Development of Chemically Amplified Resists
Compatible with 248nm Laser
Since the latter half of 1990, we have been developing chemically amplified resists that are compatible with 248nm long krypton fluoride (KrF) laser light sources. Throughout these years, we have been offering a wide range of products such as positive type, negative type, and thick film type to meet the various needs of our customers.
This resist was designed and developed for line formation. It is used in a wide range of applications including metal and implant applications.
Substrate
Si with HMDS
Resist Thickness
250nm; (Nf:1.56 at 633nm) /
190nm; (Nf:1.56 at 633nm)
Pre-bake
100℃, 60sec
TARC
TARC 44nm (RI=1.44 at 633nm)
TARC Bake
60℃, 60sec
Exposure
KrF stepper (NA: 0.75, σ: 0.60)
P.E.B
110℃, 60sec
Reticle
TOK-248-010 (6% half tone)
Development
NMD-3 2.38%, 23℃, 60sec, LD nozzle
Post-bake
100℃, 60sec
Target
Target CD: 150nm line
(Mask: 150nm, Pitch: 330nm)
TPR=250nm | TPR=190nm | ||
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Profile | LS | ||
ISO | |||
Trench |
This resist was designed and developed for hole formation. It is used in various processes including contact hole formation.
Substrate
BARC
Film Thickness
430nm(R.I.:1.56@633nm)
Pre-bake
90℃, 60sec
Exposure
KrF stepper (NA: 0.75, σ: 2/3 annular)
Mask
TOK Reticle (HT 6%)
P.E.B
110℃, 60s
Development
NMD-3 2.38%, 60s, Paddle
-0.20 | -0.15 | -0.10 | -0.05 | 0 | 0.05 | 0.10 | |
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TPR:340nm Exp:75mJ/cm2 |
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TPR:430nm Exp:79mJ/cm2 |
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TPR:520nm Exp : 86mJ/cm2 |
A wide range of KrF resists are available for the photolithography and post process applications that require properties of negative type resists.
Substrate
BARC
Resist
TDURTM-N Series
Film Thickness
400nm (Nf:1.58)
Pre-bake
90-100℃, 60sec
Exposure
KrF stepper (θ: 2/3 annular)
P.E.B.
110℃, 60s
Reticle
HT 6%
Development
NMD-3 2.38%, 60s
TDUR-N Series 38mJ / cm2 |
TDUR-N Series 38mJ / cm2 |
TDUR-N Series 38mJ / cm2 |
|
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300nm | |||
250nm | |||
200nm | |||
180nm | |||
170nm | |||
160nm | |||
150nm | |||
140nm | |||
130nm |
A positive resist that can ensure a film thickness of even 10μm, this product is used for thick film plating and staircase layer formation.
Substrate
Si with HMDS
Resist Thickness
9.2μm (RI: 1.56)
Pre-bake
140℃, 60sec
Exposure
KrF stepper (NA: 0.55, σ: 0.49)
Reticle
Binary Reticle
P.E.B
110℃, 60sec
Development
NMD-3 2.38%, 23℃, 60sec
Post-bake
100℃, 60sec
Target CD
Trench: 1.5μm space / 16.5μm pitch ; Dot: 1.5μm space / 12.0μm pitch
TDUR in the text is a pending or registered trademark of TOK.
For any questions or concerns,
Please contact us if you have any requests or problems.
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